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MODERN CHARACTERIZATION METHODS OF SURFACTANT SYSTEMS SYSTEMS

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9780824719784 ::  MODERN CHARACTERIZATION METHODS OF SURFACTANT SYSTEMS SYSTEMS
ISBN:

9780824719784

Col·lecció:SURFACTANT SCIENCE
Volum:83
EditorialTAYLOR & FRANCIS GROUP
Edició:
Pàgines:616
Il·lustrat:Si
Idioma:INGLES
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Entrega en 20 dies

DESCRIBES RECENT TECHNIQUES APPLIED TO CHARACTERIZE SURFACTANT SYSTEMS, SUCH AS SURFACTANT-STABILIZED COLLOIDS, MICELLES, MICROEMULSIONS, EMULSIONS AND FOAMS IN BOTH AQUEOUS AND NONAQUEOUS FLUIDS. THE TEXT PROBES ADSORPTION AND WETTING PHENOMENA AT INTERFACES, INCLUDING SOLID-LIQUID, LIQUID-VAPOUR AND LIQUID-LIQUID. IT PROVIDES HELPFUL EXAMPLES AND CASE STUDIES ILLUSTRATING HOW THESE TECHNIQUES MAY BE USED IN COMPLEMENTARY WAYS.

MODERN TECHNIQUES EMPLOYED FOR CHARACTERIZING SURFACTANT SYSTEMS. TECHNIQUES INVOLVING MICROSCOPY: SCANNING TUNNELING MICROSCOPY AT SOLID-LIQUID INTERFACES; ATOMIC FORCE MICROSCOPY; BREWSTER ANGLE MICROSCOPY AND ELLIPSOMETRY; CRYOGENIC TEMPERATURE TRANSMISSION ELECTRON MICROSCOPY IN THE STUDY OF SURFACTANT SYSTEMS. OPTICAL TECHNIQUES: OPTICAL TECHNIQUES FOR THE CHARACTERIZATION OF MONOLAYERS AND THIN LIQUID FILMS; FLUORESCENCE AND ESR SPECTROSCOPY; STUDIES OF INTERACTIONS BETWEEN INTERFACES ACROSS SURFACTANT SOLUTIONS EMPLOYING VARIOUS SURFACE FORCE TECHNIQUES; NON-LINEAR OPTICAL TECHNIQUES. NON-OPTICAL TECHNIQUES: AMPHIPHILES AT INTERFACES STUDIED BY SURFACE SENSITIVE X-RAY SCATTERING; NEUTRON REFLECTIVITY AT LIQUID-VAPOUR, LIQUID-LIQUID, AND SOLID-LIQUID INTERFACES; QUARTZ CRYSTAL MICROBALANCE; ELECTROACOUSTIC STUDIES OF SURFACTANT ADSORPTION; ULTRASONIC CHARACTERIZATION OF SURFACTANT-CONTAINING SYSTEMS.

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